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1

Management of Postpartum Hemorrhage

Menzies, Anya V., Poljak, Dijana, Pearl, Michael Loran, Gossner, Gabrielle, Griffin, Todd R., Burke, William M.

Journal:

Obstetrics & Gynecology

Year:

2019

File:

PDF, 86 KB

2019

2

Reliability aspects of gate oxide under ESD pulse stress

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran Chatty, Robert Gauthier, Alain Bravaix

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.38 MB

english, 2009

3

Technical progress and energy dependent production functions

Reiner Kümmel, Wolfgang Strassl, Alfred Gossner, Wolfgang Eichhorn

Journal:

Journal of Economics

Year:

1985

Language:

english

File:

PDF, 1.35 MB

english, 1985

4

RF ESD protection strategies: Codesign vs. low-C protection

W. Soldner, M. Streibl, U. Hodel, M. Tiebout, H. Gossner, D. Schmitt-Landsiedel, J.H. Chun, C. Ito, R.W. Dutton

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 1.02 MB

english, 2007

5

Dangerous parasitics of socketed CDM ESD testers

H. Gossner, T. Brodbeck

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 283 KB

english, 1997

6

INFORMATIONAL CASCADES ELICIT PRIVATE INFORMATION

Olivier Gossner, Nicolas Melissas

Journal:

International Economic Review

Year:

2006

Language:

english

File:

PDF, 286 KB

english, 2006

7

Entropy and the Value of Information for Investors

Cabrales, Antonio, Gossner, Olivier, Serrano, Roberto

Journal:

American Economic Review

Year:

2013

Language:

english

File:

PDF, 524 KB

english, 2013

8

[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Influence of Layout Parameters on Triggering Behavior in 0.35um and 0.18um Process gg-nMOS ESD Protection Devices

Litzenberger, M., Pichler, R., Pogany, D., Gornik, E., Esmark, K., Gossner, H.

Year:

2001

File:

PDF, 250 KB

2001

9

Daly and Doyen's Introduction to Insect Biology and Diversity. 3rd ed.--James B. Whitfield and Alexander H. Purcell III.

Journal:

Systematic Biology

Year:

2013

Language:

english

File:

PDF, 231 KB

english, 2013

10

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability

Paul, Milova, Kumar, B. Sampath, Gossner, Harald, Shrivastava, Mayank

Year:

2018

Language:

english

File:

PDF, 551 KB

english, 2018

11

Cross-scale effects of land use on the functional composition of herbivorous insect communities

Neff, Felix, Blüthgen, Nico, Chisté, Melanie N., Simons, Nadja K., Steckel, Juliane, Weisser, Wolfgang W., Westphal, Catrin, Pellissier, Loïc, Gossner, Martin M.

Journal:

Landscape Ecology

Year:

2019

Language:

english

File:

PDF, 625 KB

english, 2019

12

Do ESD fails in systems correlate with IC ESD robustness?

Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 433 KB

english, 2009

13

Bulk and surface degradation mode in 0.35μm technology gg-nMOS ESD protection devices

D Pogany, K Esmark, M Litzenberger, C Fürböck, H Gossner, E Gornik

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 478 KB

english, 2000

14

Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices

M. Litzenberger, R. Pichler, S. Bychikhin, D. Pogany, E. Gornik, K. Esmark, H. Gossner

Journal:

Microelectronics Reliability

Year:

2001

File:

PDF, 387 KB

2001

15

Silicon nanoelectronic devices with delta-doped layers

F. Wittmann, H. Gossner, I. Eisele

Journal:

Journal of Materials Science: Materials in Electronics

Year:

1995

Language:

english

File:

PDF, 679 KB

english, 1995

16

Study of triggering inhomogeneities in gg-nMOS ESD protection devices via thermal mapping using backside laser interferometry

M. Litzenberger, K. Esmark, D. Pogany, C. Fürböck, H. Gossner, E. Gornik, W. Fichtner

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 496 KB

english, 2000

17

Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices

D. Pogany, N. Seliger, M. Litzenberger, H. Gossner, M. Stecher, T. Müller-Lynch, W. Werner, E. Gornik

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 437 KB

english, 1999

18

Characterization and Optimization of Sub-32-nm FinFET Devices for ESD Applications

Thijs, S., Tremouilles, D., Russ, C., Griffoni, A., Collaert, N., Rooyackers, R., Linten, D., Scholz, M., Duvvury, C., Gossner, H., Jurczak, M., Groeseneken, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 482 KB

english, 2008

19

Part I: Mixed-Signal Performance of Various High-Voltage Drain-Extended MOS Devices

Shrivastava, M., Baghini, M.S., Gossner, H., Rao, V.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 1.14 MB

english, 2010

20

Saproxylic beetles as indicator species for dead-wood amount and temperature in European beech forests

Thibault Lachat, Beat Wermelinger, Martin M. Gossner, Heinz Bussler, Gunnar Isacsson, Jörg Müller

Journal:

Ecological Indicators

Year:

2012

Language:

english

File:

PDF, 535 KB

english, 2012

21

A Review on the ESD Robustness of Drain-Extended MOS Devices

Shrivastava, M., Gossner, H.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2012

Language:

english

File:

PDF, 2.40 MB

english, 2012

22

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Impact of Strain on ESD Robustness of FinFET Devices

Griffoni, A., Thijs, S., Russ, C., Tremouilles, D., Scholz, M., Linten, D., Collaert, N., Rooyackers, R., Duvvury, C., Gossner, H., Meneghesso, G., Groeseneken, G.

Year:

2008

Language:

english

File:

PDF, 378 KB

english, 2008

23

Vertical Si-Metal-Oxide-Semiconductor Field Effect Transistors with Channel Lengths of 50 nm by Molecular Beam Epitaxy

Gossner, Harald, Eisele, Ignaz, Risch, Lothar

Journal:

Japanese Journal of Applied Physics

Year:

1994

File:

PDF, 968 KB

1994

24

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Understanding the optimization of sub-45nm FinFET devices for ESD applications

Tremouilles, D., Thijs, S., Russ, C., Schneider, J., Duvvury, C., Collaert, N., Linten, D., Scholz, M., Jurczak, M., Gossner, H., Groeseneken, G.

Year:

2007

Language:

english

File:

PDF, 1001 KB

english, 2007

25

Part I: High-Voltage MOS Device Design for Improved Static and RF Performance

Gupta, Ankur, Shrivastava, Mayank, Baghini, Maryam Shojaei, Sharma, Dinesh Kumar, Gossner, Harald, Rao, V. Ramgopal

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 2.87 MB

english, 2015

26

A review on plant diversity and forest management of European beech forests

Schulze, E. D., Aas, G., Grimm, G. W., Gossner, M. M., Walentowski, H., Ammer, C., Kühn, I., Bouriaud, O., von Gadow, K.

Journal:

European Journal of Forest Research

Year:

2016

Language:

english

File:

PDF, 1.66 MB

english, 2016

27

Biodiversity at multiple trophic levels is needed for ecosystem multifunctionality

Soliveres, Santiago, van der Plas, Fons, Manning, Peter, Prati, Daniel, Gossner, Martin M., Renner, Swen C., Alt, Fabian, Arndt, Hartmut, Baumgartner, Vanessa, Binkenstein, Julia, Birkhofer, Klaus, Bl

Journal:

Year:

2016

Language:

english

File:

PDF, 5.01 MB

english, 2016

28

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Hard Failures and PCB Protection Devices

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 3.09 MB

english, 2015

29

Land-use intensification causes multitrophic homogenization of grassland communities

Gossner, Martin M., Lewinsohn, Thomas M., Kahl, Tiemo, Grassein, Fabrice, Boch, Steffen, Prati, Daniel, Birkhofer, Klaus, Renner, Swen C., Sikorski, Johannes, Wubet, Tesfaye, Arndt, Hartmut, Baumgartn

Journal:

Year:

2016

Language:

english

File:

PDF, 17.33 MB

english, 2016

30

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Soft Failure Mechanisms and PCB Design Measures

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 4.84 MB

english, 2015

31

[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Risk assessment of cable discharge events

Stadler, Wolfgang, Niemesheim, Josef, Stadler, Andreas, Koch, Sebastian, Gossner, Harald

Year:

2017

Language:

english

File:

PDF, 1.80 MB

english, 2017

32

Identification of Soft Failure Mechanisms Triggered by ESD Stress on a Powered USB 3.0 Interface

Koch, Sebastian, Orr, Benjamin J., Gossner, Harald, Gieser, Horst A., Maurer, Linus

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2018

Language:

english

File:

PDF, 1.18 MB

english, 2018

33

Cisterno-lumbar gradient of complement fractions in geriatric patients with suspected normal pressure hydrocephalus

Seele, Jana, Kirschfink, Michael, Djukic, Marija, Lange, Peter, Gossner, Johannes, Bunkowski, Stephanie, Wiltfang, Jens, Nau, Roland

Journal:

Clinica Chimica Acta

Year:

2018

Language:

english

File:

PDF, 503 KB

english, 2018

34

On the cost of misperception: General results and behavioral applications

Gossner, Olivier, Steiner, Jakub

Journal:

Journal of Economic Theory

Year:

2018

Language:

english

File:

PDF, 491 KB

english, 2018

35

Evolutionary Foundations of Rational Choice

Gossner, Olivier, Kuzmics, Christoph

Journal:

SSRN Electronic Journal

Year:

2009

Language:

english

File:

PDF, 347 KB

english, 2009

36

Arthropod decline in grasslands and forests is associated with landscape-level drivers

Seibold, Sebastian, Gossner, Martin M., Simons, Nadja K., Blüthgen, Nico, Müller, Jörg, Ambarlı, Didem, Ammer, Christian, Bauhus, Jürgen, Fischer, Markus, Habel, Jan C., Linsenmair, Karl Eduard, Nauss

Journal:

Year:

2019

File:

PDF, 10.19 MB

2019

37

System ESD robustness by co-design of on-chip and on-board protection measures

H. Gossner, W. Simbürger, M. Stecher

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 1.15 MB

english, 2010

38

Stable generalized predictive control with constraints and bounded disturbances

J.R. Gossner, B. Kouvaritakis, J.A. Rossiter

Journal:

Year:

1997

Language:

english

File:

PDF, 1.87 MB

english, 1997

39

Device Simulation and Backside Laser Interferometry––Powerful Tools for ESD Protection Development

W. Stadler, K. Esmark, H. Gossner, M. Streibl, M. Wendel, W. Fichtner, D. Pogany, M. Litzenberger, E. Gornik

Journal:

Microelectronics Reliability

Year:

2002

File:

PDF, 1.51 MB

2002

40

High abstraction level permutational ESD concept analysis

M. Streibl, F. Zängl, K. Esmark, R. Schwencker, W. Stadler, H. Gossner, S. Drüen, D. Schmitt-Landsiedel

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 413 KB

english, 2005

41

Simple Bounds on the Value of a Reputation

Olivier Gossner

Journal:

Year:

2011

Language:

english

File:

PDF, 159 KB

english, 2011

42

Part II: A Novel Scheme to Optimize the Mixed-Signal Performance and Hot-carrier Reliability of Drain-Extended MOS Devices

Shrivastava, M., Baghini, M.S., Gossner, H., Rao, V.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 1.05 MB

english, 2010

43

Reasoning-based introspection

Olivier Gossner, Elias Tsakas

Journal:

Theory and Decision

Year:

2012

Language:

english

File:

PDF, 167 KB

english, 2012

44

Does organic grassland farming benefit plant and arthropod diversity at the expense of yield and soil fertility?

Klaus, Valentin H., Kleinebecker, Till, Prati, Daniel, Gossner, Martin M., Alt, Fabian, Boch, Steffen, Gockel, Sonja, Hemp, Andreas, Lange, Markus, Müller, Jörg, Oelmann, Yvonne, Pašalić, Esther, Renn

Journal:

Agriculture, Ecosystems & Environment

Year:

2013

Language:

english

File:

PDF, 1.00 MB

english, 2013

45

ESD Evaluation of the Emerging MuGFET Technology

Russ, C., Gossner, H., Schulz, T., Chaudhary, N., Weize Xiong,, Marshall, A., Duvvury, C., Schrufer, K., Rinn Cleavelin, C.R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2007

Language:

english

File:

PDF, 1.49 MB

english, 2007

46

[IEEE Comput. Soc . 17th International Conference on VLSI Design - Mumbai, India (5-9 Jan. 2004)] 17th International Conference on VLSI Design. Proceedings. - ESD protection for the deep sub micron regime - a challenge for design methodology

Year:

2004

Language:

english

File:

PDF, 867 KB

english, 2004

47

Análisis estilístico de los "Milagros de Nuestra Señora" de Berceoby Carmelo Gariano

Review by: J. W. Gossner

Journal:

Year:

1967

Language:

english

File:

PDF, 370 KB

english, 1967

48

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Unique ESD Failure Mechanism in a MuGFET Technology

Gossner, Harald, Russ, Christian, Siegelin, Frank, Schneider, Jens, Schruefer, Klaus, Schulz, Thomas, Duvvury, Charvaka, Cleavelin, C. Rinn, Xiong, Weize

Year:

2006

Language:

english

File:

PDF, 2.80 MB

english, 2006

49

ESD Investigations of Multiwalled Carbon Nanotubes

Shrivastava, Mayank, Kulshrestha, Neha, Gossner, Harald

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 1.38 MB

english, 2014

50

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reliability aspects of gate oxide under ESD pulse stress

Ille, Adrien, Stadler, Wolfgang, Pompl, Thomas, Gossner, Harald, Brodbeck, Tilo, Esmark, Kai, Riess, Philipp, Alvarez, David, Chatty, Kiran, Gauthier, Robert, Bravaix, Alain

Year:

2007

Language:

english

File:

PDF, 1.09 MB

english, 2007

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